Buy CA-60D Professional Thermal Analyzer Factory, Products

Engineered as a high‑performance benchtop thermal analysis instrument, the CA‑60D adopts a 640×512 infrared detector and achieves thermal sensitivity below 50 mK. Tailored for lab‑standard thermal characterization tasks, it fills the performance gap between portable thermal inspection devices and high‑cost research‑grade equipment, offering scientific‑level analytical performance with cost‑effective pricing. Powered by comprehensive PC‑compatible software, this unit records complete radiometric video streams, carries out multi‑dimensional data correlation analysis, and works with external sensors to realize synchronous acquisition of temperature, voltage and current data. It serves as an ideal testing tool for R&D laboratories to assess thermal management schemes, semiconductor properties and material performance under diverse loading scenarios. 

Product Description

Product Information

Scientific-Grade Analysis Software

Scientific-Grade Analysis Software

The CA‑60D relies on a full‑featured software platform to convert raw thermal readings into practically usable engineering insights. Connecting to a Windows‑based PC over USB, this software delivers an abundant set of analytical functions: real‑time and post‑recording video evaluation, temperature trend plotting, isotherm visualization, as well as point, line and polygon‑shaped measurement areas, alongside data export to Excel format. Operators are allowed to set up numerous measurement zones with separate emissivity parameters. This capability proves especially vital for assessing circuit boards integrating metallic traces, ceramic enclosures and plastic connectors on one single surface.

Optional Macro Lens for 50μm-Level Detection

Optional Macro Lens for 50μm-Level Detection

For scenarios where native resolution cannot meet the analysis demands of fine‑pitch electronic parts, the CA‑60D supports a special macro lens, which allows detection of targets down to 50 micrometers. Under this magnified view, discrete IC pins, wire bonds and micro‑vias can be observed through thermal imaging. This makes it feasible to investigate die‑level heat generation, verify the reliability of solder joints, and characterize thermal performance of tiny components including 0201‑format resistors and fine‑pitch QFN packages.

3D Thermal Field Visualization

3D Thermal Field Visualization

Going past conventional two‑dimensional thermal heatmaps, the CA‑60D generates an interactive 3D thermal field showing full‑board temperature distribution. This volumetric visual output instantly highlights overheating components, reveals how heat spreads across the PCB, and verifies whether thermal‑management hardware including heatsinks and copper pours work as designed. Engineers may rotate and magnify the 3D model to examine thermal gradients surrounding specific integrated circuits, capacitors and power regulation devices.

Multi-Dimensional Data Correlation

Multi-Dimensional Data Correlation

Thermal performance hardly occurs independently; it is governed by electrical loading, surrounding‑environment factors and material characteristics. To cope with such real‑world working conditions, the CA‑60D permits concurrent connection of external USB‑based sensors, among which are ambient temperature probes and load power monitors. Within the software, voltage, current and temperature traces are plotted along a unified time axis. This enables engineering staff to pinpoint cause‑and‑effect correlations, for instance local heat buildup induced by current surges, or measurement baseline shifts brought about by ambient temperature drift.

Multi-curve Analysis

Multi-curve Analysis

Boasting robust multi‑curve analysis functions, the CA‑60D Thermal Analyzer is capable of gathering temperature readings from measuring points, measuring lines and target regions at the same time. Multiple curve traces are rendered concurrently, delivering visual comparison and trend tracking for temperature variations across different objects. It supports fast assessment of thermal steady‑state conditions and heat fluctuations, and allows users to conduct high‑efficiency thermal‑performance evaluation for electronic components and heat‑dissipation materials.

Stable Multi-Angle Adjustable Frame

Stable Multi-Angle Adjustable Frame

Accurate thermal characterization demands mechanical rigidity and versatile positioning options. The CA‑60D pairs with a heavy‑duty multi‑axis adjustment stand, which lets users position the sensor module at nearly any angle toward the specimen under test. Manual focusing enables precise sharpness tuning across working distances ranging from 40 mm up to 2000 mm.

High-Definition Thermal Imaging for IC Inspection

High-Definition Thermal Imaging for IC Inspection

Coupled with the 9.1 mm standard optic, the 640×512 detector delivers highly‑detailed thermal imagery capable of resolving separate IC package pins as well as nearby thermal signatures. Such image sharpness is indispensable for troubleshooting faults including cold solder connections, BGA components suffering from internal delamination, and power MOSFETs operating above their rated thermal limits.

High‑Temperature Alarm

High‑Temperature Alarm

The CA‑60D Thermal Analyzer comes with a highly useful over‑temperature warning feature. Once users activate the temperature alarm setting, the buzzer will trigger an acoustic alert if measured temperature goes beyond the preconfigured threshold. Simultaneously, a red flashing border appears around the target zone on‑screen. Thanks to this combined sound‑and‑visual warning system, the unit quickly detects unexpected temperature surges. It assists technicians in catching potential over‑heating hazards promptly and delivers enhanced safety and dependability throughout thermal‑testing procedures.

Specification

Parameter Value
IR Resolution 640 × 512 pixels
Spectral Range 8 ~ 14 μm
Thermal Sensitivity (NETD) < 50 mK @ 25°C
Field of View 48.7° (H) × 38.6° (V)
IFOV 1.3 mrad
Frame Rate 25 Hz
Focus Manual
Measurement Range -20°C ~ 550°C
Measurement Accuracy -20~120°C: ±2°C/±2%
-120~550°C: ±3°C/±3%
Measurement Modes Max, min, average
Optimal Distance 4 ~ 200 cm
Macro Lens (Optional) 60 ~ 100 mm (detects 25μm)
Emissivity 0.1 ~ 1.0 (adjustable)
Image File Full radiometric JPG
Radiometric Recording .dyv (analysis software)
Min Sampling Interval 40 ms
Operating Temperature -10°C ~ +55°C
External Devices USB temp sensor, USB power meter
Software Functions Temp curves, isothermal lines, 3D thermal field, point/line/polygon measurement, temp alarms, Excel export, full radiometric video

Frequently Asked Questions

What is the detector resolution and thermal sensitivity of the CA-60D?

The CA-60D features a high-definition infrared detector with a resolution of 640 × 512 pixels and a thermal sensitivity (NETD) of < 50 mK @ 25°C, operating at a 25 Hz frame rate for precise thermal inspection.

Can the CA-60D inspect small components like 0201 resistors and fine IC pins?

Yes, with the optional macro lens, the analyzer supports target detection down to 50 micrometers (and close-up target detection down to 25μm), allowing clear observation of discrete IC package pins, wire bonds, and micro-vias.

How does the high-temperature alarm function notify users?

When a measured temperature exceeds the preset threshold, the system triggers an acoustic buzzer alert along with a red flashing border around the target zone on-screen for instant visual and sound alerts.

Can external hardware sensors be integrated with the software?

Yes, the CA-60D software allows concurrent connection of USB-based external sensors such as ambient temperature probes and load power monitors, plotting voltage, current, and temperature on a synchronized timeline.

What file formats and measurement tools are supported for data export?

The device captures full radiometric JPG images and .dyv radiometric video files. The software supports temperature curves, 3D thermal field displays, isothermal lines, point/line/polygon area tools, and Excel data export.

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